Investigation of the Dislocation Behavior of 6- and 8-Inch AlGaN/GaN HEMT Structures with a Thin AlGaN Buffer Layer Grown on Si Substrates
datacite.relatedItem.firstPage | 207 | |
datacite.relatedItem.issue | 8 | |
datacite.relatedItem.relatedIdentifierType | ISSN | |
datacite.relatedItem.relatedItemIdentifier | 2304-6740 | |
datacite.relatedItem.relationType | IsPublishedIn | |
datacite.relatedItem.title | Inorganics | |
datacite.relatedItem.volume | 12 | |
dc.contributor.author | Yujie Yan | |
dc.contributor.author | Jun Huang | |
dc.contributor.author | Lei Pan | |
dc.contributor.author | Biao Meng | |
dc.contributor.author | Qiangmin Wei | |
dc.contributor.author | Bing Yang | |
dc.date.accessioned | 2024-09-13T09:51:58Z | |
dc.date.available | 2024-09-13T09:51:58Z | |
dc.date.issued | 2024 | |
dc.identifier.doi | https://doi.org/10.3390/inorganics12080207 | |
dc.identifier.other | jz000077-0199 | |
dc.identifier.uri | https://tustorage.ulb.tu-darmstadt.de/handle/tustorage/10194 | |
dc.publisher | MDPI AG | |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | |
dc.subject.ddc | 540 | |
dc.title | Investigation of the Dislocation Behavior of 6- and 8-Inch AlGaN/GaN HEMT Structures with a Thin AlGaN Buffer Layer Grown on Si Substrates | |
dc.type | Article | |
dcat.distribution.pdf | https://tustorage.ulb.tu-darmstadt.de/handle/tustorage/10195 | |
dcat.distribution.supplierxml | https://tustorage.ulb.tu-darmstadt.de/handle/tustorage/10196 | |
dspace.entity.type | Dataset | |
relation.isDistributionOfDataset | d90da78b-9967-4b81-a3ae-c31aafa08e38 | |
relation.isDistributionOfDataset | 65e95df8-0bfe-4cbd-af46-9d2c007350ba | |
relation.isDistributionOfDataset | 3f350910-297e-46f8-85ff-5f6e0e628b5b | |
relation.isDistributionOfDataset.latestForDiscovery | d90da78b-9967-4b81-a3ae-c31aafa08e38 | |
wdm.archivematicaaipuuid.original | 1e389973-99d2-4827-b49f-731fc6a7d60a |